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| Publisher:Shanghai Jinghong Kepu Optoelectronics Technology Co., Ltd. Release time:2025-06-25 15:15:54 Click count:15 Close |
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Main functions: semiconductor material SI SIC, etc. Compatible size: 6-inch-12-inch wafer or spindle Single Raman spectroscopy detection equipment integrates XRD stress analysis + SIMS ion detection + FTIR organic matter analysis function It has the detection of non-destructive deep stress distribution, process residue analysis and doping concentration analysis. |
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