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The first silicon carbide ingot deep stress testing equipment in China was successfully delivered! |
| Publisher:Shanghai Jinghongkepu Optoelectronics Technology Co., Ltd Release time:2025-06-26 09:18:25 Click count:228 Close |
April 28, 2025 is a milestone date for our company. On this day, the first silicon carbide deep stress testing equipment independently developed by our company was successfully delivered, which is not only a major breakthrough on the road of technological innovation of our company, but also injects new vitality into the development of the entire industry.
The silicon carbide deep stress testing equipment developed by our company adopts the world's leading non-destructive testing technology. Unlike traditional methods, this technique can penetrate deep into the material and accurately measure the stress distribution without destroying or sampling the material. Whether it's subtle stress changes on the surface of a material or stress concentrations deep inside, the equipment can accurately capture them. Through advanced algorithms and high-precision sensors, the equipment can improve the stress detection accuracy to the industry-leading level, ensuring that every silicon carbide material achieves optimal performance. The successful delivery of this equipment is the result of countless days and nights of hard work by our R&D team. From the exploration of technical principles, to the research and development of key components, to the assembly and commissioning of equipment, every link has been tried and optimized repeatedly. The team members overcame one technical difficulty after another, and finally realized the perfect leap from theory to practice. |
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